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AbstractAbstract
[en] This paper reports on the effect of parasitic capacitance Cp on dc SQUID characteristics and noise performance studied using a test structure consisting of 11 identical SQUID washers with Nb films of various widths covering the slit. The measured IV characteristics are in good agreement with simulations based on a simple lumped circuit model
Secondary Subject
Source
1990 applied superconductivity conference; Snowmass, CO (United States); 24-28 Sep 1990; CONF-900944--
Record Type
Journal Article
Literature Type
Conference
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