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[en] This paper reports the electric resistance measured in real time during laser evaporation deposition of superconducting thin films. It was found that different substrates led to different behaviors in the temporal change of the resistance. The results are consistent with the process of nucleation, interface reaction and bulk-like growth. Structural transformation was also observed due to oxygen backfilling at the final stage of the deposition
Source
Christen, D. (Oak Ridge National Lab., Oak Ridge, TN (United States)); Narayan, J. (North Carolina State Univ., Raleigh, NC (United States)); Schneemeyer, L. (AT and T Laboratories, Murray Hill, NJ (United States)); 1322 p; ISBN 1-55899-057-7; 
; 1990; p. 489-495; Materials Research Society; Pittsburgh, PA (United States); Materials Research Society fall meeting; Boston, MA (United States); 27 Nov - 2 Dec 1989; CONF-891119--; Materials Research Society, 9800 McKnight Rd., Suite 327, Pittsburgh, PA 15237 (USA)
; 1990; p. 489-495; Materials Research Society; Pittsburgh, PA (United States); Materials Research Society fall meeting; Boston, MA (United States); 27 Nov - 2 Dec 1989; CONF-891119--; Materials Research Society, 9800 McKnight Rd., Suite 327, Pittsburgh, PA 15237 (USA)