[en] The aim of the present work has been to investigate scandium distribution in OKh16N15M3T steel. The dopping with scandium is known to be an efficient means to improve the resistance of steel to radiation embrittlement, swelling and creep. The layer-by-layer distribution of the components has been studied by the secondary ion mass spectroscopy (SIMS) through sputtering the samples by a 4 keV argon ion beam and detecting the peak intensity variations of scandium and its oxides with time. The experimental data obtained give evidence for a high enrichment of the steel subsurface layer with scandium. This layer may extend to a depth of several micrometers, depending on the duration and temperature of annealing, as well as on the initial content of scandium in the sample. 2 refs.; 3 figs.; 2 tabs