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AbstractAbstract
[en] A quantitative interconnection between the dose of n-Si monocrystal ion doping, the lifetime of nonequilibrium current carriers and the deficiency level of the presurface destroyed layer is ascertained according to Frenkel pairs. The method of the surface photo-emf can be applied for the conducting of accurate quantitative measurement of minor doses of implanted ions
Original Title
Vliyanie defektoobrazovaniya v implantirovannom kremnii na vremya zhizni neravnovesnykh nositelej
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Journal Article
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