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Hoeier, R.; Marthinsen, K.; Bakken, L.N.; Holmestad, R.
Stiftelsen for Industriell og Teknisk Forskning (SINTEF), Trondheim (Norway)1992
Stiftelsen for Industriell og Teknisk Forskning (SINTEF), Trondheim (Norway)1992
AbstractAbstract
[en] A method for accurate determination of structure parameters from 2-dimensional (2-D) convergent beam patterns is described. The method utilizes the strong intensity variations which may be obtained in CBED disks, particularly in the non-systematic many-beam case. A fit index based on pixel by pixel comparisons between theory and experiment is defined and the refinable parameters area are determined through the minimalization of this fit index to a global minimum. For this minimalization the Polak Ribiere conjugate gradient method is used. So far digitized experimental data have been obtained from film using a CCD camera, but a system for acquiring digitized energy filtered data are under implementation in the authors laboratory. It is based on a modified energy loss system which is modified in the sense that the detector array can be rotated 90o. In this mode the array records a 1-dimensional energy filtered line profile of 1024 pixels through the CBED disk imaged onto a narrow slit in the spectrometer. A 2-D energy filtered image is then obtained by shifting the CBED disk stepwise across the spectrometer entrance slit. Some aspects of the minimalization procedure is discussed in relation to a theoretical 21-parameter example from InP. 4 refs
Source
Dec 1992; 4 p; ISBN 82-595-7637-6;
; Available from SINTEF, N-7034 Trondheim, Norway

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