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Dutta, J.; Dorier, J.L.; Hollenstein, C.; Howling, A.A.; Sansonnens, L.; Nieswand, C.; Fasoli, A.; Stoto, T.
Ecole Polytechnique Federale, Lausanne (Switzerland). Centre de Recherche en Physique des Plasma (CRPP)1993
Ecole Polytechnique Federale, Lausanne (Switzerland). Centre de Recherche en Physique des Plasma (CRPP)1993
AbstractAbstract
[en] Visible photoluminescence at room temperature has been observed in silicon particulates prepared in a silane rf plasma. Photoluminescence measurements were carried out on 'as-deposited' particulates and also on particulates suspended in the plasma during processing. The photoluminescence spectrum peaks at 730 nm and 780 nm (using the 488 nm line of an Ar+ ion laser), partly covering the visible region, for some of the particulates suspended in the plasma and for the others collected on a steel plate, respectively. It is suggested that the photoluminescence originates from nanocrystallites of silicon formed in these particulates. The in situ photoluminescence measurements in processing plasmas could serve as a diagnostic tool for plasmas involving particulate formation. (author) 4 figs., 20 refs
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Jul 1993; 16 p
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Report
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Numerical Data
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ALLOYS, AMPLIFIERS, CARBON ADDITIONS, CHARGED PARTICLES, DATA, ELECTROMAGNETIC RADIATION, ELEMENTS, EMISSION, EQUIPMENT, HYDRIDES, HYDROGEN COMPOUNDS, INFORMATION, IONS, IRON ALLOYS, IRON BASE ALLOYS, LUMINESCENCE, NUMERICAL DATA, PARTICLES, PHOTON EMISSION, RADIATIONS, SEMIMETALS, SILICON COMPOUNDS, TEMPERATURE RANGE
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