Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.017 seconds
Bunch lengthening and purity measurements of single-bunched beam by photon counting method in KEK-PF
Obina, Takashi; Takeo, Tetsuhiro; Tobiyama, Makoto; Kasuga, Toshio; Katsura, Tomotaro.
Proceedings of the 8th symposium accelerator science and technology1992
Proceedings of the 8th symposium accelerator science and technology1992
AbstractAbstract
[en] A photon counting system was installed in beamline 21 in the Photon Factory at the KEK in order to measure the bunch time structure in the single bunch mode. Large dynamic range and high time resolution of the system enables us to measure the single bunch impurity precisely and the bunch length. From the bunch lengthening measurement, the coupling impedance of |Z/n| = 1.2 Ω was obtained. The resolution of 10-5 was achieved in the impurity measurement. (author)
Primary Subject
Source
Institute of Physical and Chemical Research, Wako, Saitama (Japan); 479 p; 1992; p. 298-300; Ionics Publishing Co., Ltd; Tokyo (Japan); 8. symposium on accelerator science and technology; Wako, Saitama (Japan); 25-27 Oct 1991
Record Type
Book
Literature Type
Conference
Country of publication
Reference NumberReference Number
Related RecordRelated Record
INIS VolumeINIS Volume
INIS IssueINIS Issue