[en] A series of investigations involving the use of different nuclear methods with ³He⁺ ion-beams is presented for the low-level determination of some light elements (mainly B, C, N, O). As there is always a demand for interference-free techniques for the measurement of light elements, a critical evaluation of the analytical potential of the methods of interest is provided. The techniques assessed include: nuclear reaction analysis; prompt γ-ray spectrometry and prompt X-ray spectrometry. Of particular interest is the role played by interelemental interferences. Typical practical applications of the relevant methods for operation under routine conditions are discussed. In addition, the phenomenon of secondary excitation, leading to enhanced photon yields, is considered, for prompt X-rays observed in binary metal fluorides. (author) 21 refs.; 5 figs.; 5 tabs