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AbstractAbstract
[en] A description of the Segmented Wire Ion chambers, typically known as SWICs, is given. These devices have been used at Fermilab since 1972 to monitor the particle beam profiles of the various beamlines. Many modifications and improvements have been made since that time. SWICs are presently used to display beam profiles at intensities from 106 to over 1013 particles/sec
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Sep 1993; 12 p; CONTRACT AC02-76CH03000; Available from OSTI as DE94001353; NTIS; US Govt. Printing Office Dep
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