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AbstractAbstract
[en] A study has been made of the X-ray luminescence patterns of Ce3+ and Tb3+ ions in model glasses with the composition (mole %) 22Na2O·3CaO·75SiO2 synthesized under different redox conditions. It was established that the intensity of this luminescence and its dose and concentration function were strongly affected by radiation-stimulated overcharging of these dopants and electron capture by the precursors of electron color centers stable at the temperature employed. An especially large part was played by such impurity electron acceptors as Fe3+ and Ce4+ ions, which reduced the efficiency of Tb3+ and Ce3+ X-ray luminescence by a factor of 2 or more in comparison with that for glasses having the minimum possible Fe3+ or Ce4+ concentration. As the dose increased, the Ce4+ or Fe3+ concentration in glasses containing these ions fell as a result of radiation-induced reduction, and a greater role was played by recombination of the electrons newly generated in the glass matrix with the accumulated overcharged (Ce3+)+ or (Tb3+)+ activator centers. This led to a rise in Ce3+ or Tb3+ X-ray luminescence intensity during irradiation; the increment could be several times the initial intensity. This paper discusses possible mechanisms for transfer of excitation energy from the matrix to dopant ions and the role in this transmission of charge carriers formed in the glass matrix under the action of X-rays
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Source
Translated from Fizika i Khimiya Stekla; 18: No. 2, 96-106(Mar-Apr 1992). Cover-to-cover-translation of Fizika i Khimiya Stekla (USSR). Cover-to-cover-translation of Fizika i Khimiya Stekla (USSR). Cover-to-cover-translation of Fizika i Khimiya Stekla (USSR). Cover-to-cover-translation of Fizika i Khimiya Stekla (USSR).
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Journal Article
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Translation
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Country of publication
ALKALI METAL COMPOUNDS, ALKALINE EARTH METAL COMPOUNDS, CALCIUM COMPOUNDS, CAPTURE, CHALCOGENIDES, CHARGED PARTICLES, CHEMICAL REACTIONS, CRYSTAL DEFECTS, CRYSTAL STRUCTURE, ELEMENTS, EMISSION, METALS, OXIDES, OXYGEN COMPOUNDS, PHOTON EMISSION, POINT DEFECTS, RARE EARTHS, SILICON COMPOUNDS, SODIUM COMPOUNDS, SPECTROSCOPY, VACANCIES
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