Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.025 seconds
[en] This paper presents the results of simulation of localized charge carrier lifetime reductions in 10 kV power diodes. These results are compared to experiments with proton irradiation as means for local lifetime reductions. It is shown that also the range straggling inherent in the irradiation process must be taken into account in the simulations
Journal
