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AbstractAbstract
[en] A mono-energetic positron beam was applied for a study of native defects in GaAs. From measurements of Doppler broadening profiles and lifetime spectra of positrons, it was found that Ga-vacancies were introduced by Si-doping. On the other hand, for p-type GaAs, interstitial clusters were found to be introduced by Zn-doping. The observed species of defects are in agreement with those expected from the Fermi level. (orig.)
Source
34. Yamada conference - 9. conference on hyperfine interactions: New areas and topics in hyperfine interactions detected by nuclear radiations; Osaka (Japan); 17-21 Aug 1992
Record Type
Journal Article
Literature Type
Conference
Journal
Country of publication
ANNIHILATION, BRIDGMAN METHOD, CARRIER DENSITY, CRYSTAL DEFECTS, DOPED MATERIALS, DOPPLER BROADENING, DOPPLER EFFECT, FERMI LEVEL, GALLIUM ARSENIDES, INTERSTITIALS, LIFETIME, LINE BROADENING, POSITRON BEAMS, POSITRONS, PROBES, P-TYPE CONDUCTORS, SILICON ADDITIONS, TEMPERATURE DEPENDENCE, VACANCIES, ZINC ADDITIONS
ANTILEPTONS, ANTIMATTER, ANTIPARTICLES, ARSENIC COMPOUNDS, ARSENIDES, BEAMS, CRYSTAL GROWTH METHODS, CRYSTAL STRUCTURE, ELEMENTARY PARTICLES, ENERGY LEVELS, FERMIONS, GALLIUM COMPOUNDS, INTERACTIONS, LEPTON BEAMS, LEPTONS, MATERIALS, MATTER, PARTICLE BEAMS, PARTICLE INTERACTIONS, PNICTIDES, POINT DEFECTS, SEMICONDUCTOR MATERIALS
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