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[en] Ceramics are widely used as capacitors and varistors. Their electrical properties depend on the structure, which is deeply influenced not only by the composition of raw materials and additives but also by heating treatments in the production process. This paper reviews our investigations of SrTiO3 ceramic devices, which have been performed using various microscopy techniques such as high-resolution transmission electron microscopy (HRTEM), cathodoluminescence scanning electron microscopy (CLSEM), field emission SEM (FE-SEM), energy dispersive X-ray spectroscopy (EDS), electron energy-loss spectroscopy (EELS) and high angle annular dark field (HAADF) imaging method in a FE-(scanning) transmission electron microscope(FE-(S)TEM). (author)
Source
Warsaw University of Technology, Faculty of Materials Science, Warsaw (Poland); 447 p; ISBN 83-907892-4-8; 
; 1999; p. 87-94; 10. Conference on Electron Microscopy of Solids; Warsaw-Serock (Poland); 20-23 Sep 1999; Available at Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-910 Warsaw,Poland; 8 refs, 6 figs
; 1999; p. 87-94; 10. Conference on Electron Microscopy of Solids; Warsaw-Serock (Poland); 20-23 Sep 1999; Available at Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-910 Warsaw,Poland; 8 refs, 6 figs