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[en] Mechanical properties of Bi ion implanted and unimplanted amorphous Ge (a-Ge) films were studied by microhardness test. Cyclic load-unload indentation tests were performed to determine the hardness and ductility of both type of specimen. The Vickers indentations were investigated by means of scanning electron microscope. Observation and analysis of Vickers indent can to conclusion about ductility and brittleness of the samples. (author)
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Warsaw University of Technology, Faculty of Materials Science, Warsaw (Poland); 447 p; ISBN 83-907892-4-8; 
; 1999; p. 359-362; 10. Conference on Electron Microscopy of Solids; Warsaw-Serock (Poland); 20-23 Sep 1999; HNSF CONTRACT NO. OTKA T 030833; Available at Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-910 Warsaw,Poland; 7 refs, 2 figs
; 1999; p. 359-362; 10. Conference on Electron Microscopy of Solids; Warsaw-Serock (Poland); 20-23 Sep 1999; HNSF CONTRACT NO. OTKA T 030833; Available at Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-910 Warsaw,Poland; 7 refs, 2 figs