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AbstractAbstract
[en] The real porous Si surface's elemental and compositions are studied by Auger electron spectroscopy (AES) and thermostimulated exo emission (TSEE) with mass spectrometry (MS) analysis in situ.The kinetic and energetic parameters of the processes resulting in TSSE and also concentration of electron traps are evaluated. The presence of adsorbates and significant dielectric coatings on the developed surface of por-Si might have a significant role in luminescent properties of por-Si
Original Title
Elektronno-emyisyijna spektroskopyiya poverkhon' poruvatogo kremnyiyu
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Record Type
Journal Article
Journal
Ukrayins'kij Fyizichnij Zhurnal; ISSN 0372-400X;
; v. 45(8); p. 985-993

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