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Stihi, C.; Popescu, I.; Busuioc, G.; Dima, G.; Iordan, M.; Badica, T.; Olariu, A.
National Physics Conference2000
National Physics Conference2000
AbstractAbstract
[en] A quantitative PIXE method applicable to plant samples is described in this work along with the results obtained from the elemental analysis of leaves from plants used as vegetables. Six groups of plants grown in different conditions were measured by using PIXE method to establish a relationship between the elemental map and growth fertiliser conditions. The target samples were bombarded with 3 MeV protons beam obtained at Tandem Accelerator of IFIN-HH Bucharest and X-rays were detected with HpGe detector with 160 eV at 5.9 KeV energy resolution. The characteristic X-ray spectra were recorded using an acquisition system with a PC computer. The concentration obtained for the chemical elements P, Ca, Mg, K, Na, Fe, Mn, Zn, and Cu, that give a great nourishment value of Basella plants, have an estimated precision between 5% and 10%. (authors)
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Oancea, Margareta; Sandu, Doina; Calboreanu, Rodica (Documentation and Publishing Office, Horia Hulubei, National Institute for Physics and Nuclear Engineering, PO Box MG-6, RO-76900 Bucharest-Magurele (Romania)); Romanian Physical Society, PO Box MG-6, RO-76900 Bucharest-Magurele (Romania); 126 p; 2000; p. 93; National Physics Conference; Constanta (Romania); 21-23 Sep 2000; Available from author(s) or Documentation and Publishing Office, Horia Hulubei National Institute for Physics and Nuclear Engineering, PO Box MG-6, RO-76900 Bucharest-Magurele (RO); Available from Documentation and Publishing Office, Horia Hulubei National Institute for Physics and Nuclear Engineering, PO Box MG-6, RO-76900 Bucharest-Magurele (RO); Short communication
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Miscellaneous
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Conference
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