Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.015 seconds
Sokell, E.; Currell, F.J.; Watanabe, H.; Ohtani, S.
Proceedings of the international seminar on atomic processes in plasmas2000
Proceedings of the international seminar on atomic processes in plasmas2000
AbstractAbstract
[en] A new technique for measuring electron impact ionisation cross-sections using an EBIT is presented. The method involves determining the charge distribution of ions extracted from the trap after well defined confinement times. Analysis of the onsets for the appearance of particular charge states in the trap gives ionisation rates which may be converted, under appropriate conditions, to relative cross-sections without theoretical input. The method has been used to make measurements for Ar15+, Ar16+ and Ar17+. (author)
Primary Subject
Source
Kato, Takako; Murakami, Izumi (eds.); National Inst. for Fusion Science, Nagoya (Japan); 223 p; Jan 2000; p. 190-191; International seminar on atomic processes in plasmas; Toki, Gifu (Japan); 29-30 Jul 1999; 5 refs.
Record Type
Report
Literature Type
Conference
Report Number
Country of publication
Reference NumberReference Number
Related RecordRelated Record
INIS VolumeINIS Volume
INIS IssueINIS Issue