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Yokoyama, H.; Haruna, K.
Proceedings of the international symposium on advanced sensors for metals processing1999
Proceedings of the international symposium on advanced sensors for metals processing1999
AbstractAbstract
[en] This paper describes the surface inspection technique to detect uneven defects and measure its depth on rough and irregular reflectivity surface. We have applied image processing technique and eddy current sensor. So far, we performed the following examination by use of hot-rolled strip: the way of defect detection by using automatic thresholding and shape modification with morphological operation; the classification of the defect grade; and the decision of the grinding condition by the defect depth. Experiment results show that the proposed technique is effective. (author)
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Brusey, B.W. (Dofasco Inc., Hamilton, Ontario (Canada)); Bussiere, J.F. (Industrial Materials Inst., NRC, Boucherville, Quebec (Canada)); Dubois, M. (GE Corporated R and D, Schenectady, New York (United States)); Moreau, A. (Industrial Materials Inst., NRC, Boucherville, Quebec (Canada)) (eds.); Canadian Inst. of Mining, Metallury and Petroleum, Montreal, Quebec (Canada); 396 p; ISBN 0-919086-92-6;
; 1999; p. 113-119; Advanced sensors for metals processing - 38. annual conference of metallurgists of CIM. Gateway to the 21st Century; Quebec City, PQ (Canada); 22-26 Aug 1999; 4 refs., 2 tabs., 7 figs.

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