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Tsukernik, A; Pavelski, A.; Slutzky, M.; Potashnik, O.; Barad, S.; Luryi, S.; Cho, A.; Shtrikman, H.
Book of Program and Abstracts of the 45th Annual Meeting of the Israel Physical Society and the Second Conference of the Israel Plasma Science and Technology Association1999
Book of Program and Abstracts of the 45th Annual Meeting of the Israel Physical Society and the Second Conference of the Israel Plasma Science and Technology Association1999
AbstractAbstract
[en] We show that I-V characteristics of thermionic current from a semiconductor with the Fermi energy Efl into a semiconductor with the Fermi energy Ef2 over a ballistic barrier. exhibits strong maximum in dI/dV at eV=ΔEf≡ Ef2-Ef1. It could be a simple method for Fermi energy measurement in one of the semiconductors provided that the Fermi energy of the second one is known. However, in order to meet the ballistics requirement the barrier has to be so thin that tunneling contribution could not be ignored. We demonstrate that even for thick non-ballistic barrier with build-in positive charge dI/dV has a well pronounced maximum at the same point, namely at eV=ΔEf. Our calculations were successfully tested in n-GaAs/AlGaAs/n-GaAs sandwich where AlGaAs barrier was artificially charged by introducing Si δ-doping in the middle of the barrier. In heavily Sn doped sandwiches there is no need to charge the barrier artificially since the diffusion of a small amount of Sn into the barrier during a growth provides charge sufficient to observe the above described feature. We grew by molecular-beam epitaxy (MBE) a set of n-InGaAs/AlInAs/n-InGaAs heterojunctions with fixed low n1≅ 5 x 1017 cm-3 carrier concentration in tile first InGaAs, fixed chemical composition of the barrier and a variable doping concentration n2 in the second InGaAs layer in the range n2 : 1018 -: 4 x 1019 cm-3. Tile carrier densities in each layer were measured by standard Hall effect technique and were found to be consistent with the doping levels confirmed by SIMS measurements. The dI/dV of the I-V characteristics of the junctions exhibit sharp peak for all samples. It's position on the voltage axes, being interpreted as ΔEf allow us to extract the dependence of Ef2 on carrier density, n2. This dependence strongly deviates from standard theoretical predictions. The most striking observed anomaly is the near saturation of the Fermi level at a value Ef ≅ 130 MeV when the mobile carrier concentration exceeds 1019 cm-3. Photoluminescence measurements on the same set of samples allow independent evaluation of Ef2, which is consistent with tile data obtained from the transport experiments. In addition a pronounced discrete peak appears in the photoluminescence spectrum just above Ef2 in the heavily doped samples which show the saturation behaviour. Our results call for a thorough re-examination of the existing theory
Source
Israel Physical Society (Israel); 228 p; 18 Mar 1999; p. 29; 45. Annual Meeting of the Israel Physical Society; Tel-Aviv (Israel); 18 Mar 1999; 2. Conference of the Israel Plasma Science and Technology Association; Tel-Aviv (Israel); 18 Mar 1999
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