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Pedrero, E.; Larramendi, E.; Calzadilla, O.
International Atomic Energy Agency, Viena (Austria); Centro de Estudios Aplicados al Desarrollo Nuclear, La Habana (Cuba); Agencia de Energia Nuclear, La Habana (Cuba); Instituto Superior de Ciencia y Tecnologia Nuclear, La Habana (Cuba); Centro de Informacion de la Energia Nuclear, La Habana (Cuba); Centro de Tecnologia Nuclear, La Habana (Cuba); Instituto de Investigaciones Fundamentales de la Agricultura Tropical, La Habana (Cuba)1999
International Atomic Energy Agency, Viena (Austria); Centro de Estudios Aplicados al Desarrollo Nuclear, La Habana (Cuba); Agencia de Energia Nuclear, La Habana (Cuba); Instituto Superior de Ciencia y Tecnologia Nuclear, La Habana (Cuba); Centro de Informacion de la Energia Nuclear, La Habana (Cuba); Centro de Tecnologia Nuclear, La Habana (Cuba); Instituto de Investigaciones Fundamentales de la Agricultura Tropical, La Habana (Cuba)1999
AbstractAbstract
[en] Depth and composition of CdZnSe thin films grown by Chemical Bath Deposition were characterized by Rutherford Backscattering Spectrometry. Depth and the relative cuantitity of Se, both decrease when annealed in air. The films have a non-stoichiometric Cd:Zn:Se composition constant from the substrate to the surface , with vacancies of Se. After annealing all the films come up to a similar composition: Cd( Zn 0.2 )Se
Original Title
Caracterizacion por rbs de capas de cdznse crecidas por deposicion quimica (cbd)
Primary Subject
Source
1999; 5 p; 2. NURT 1999; La Habana (Cuba); 26-29 Oct 1999; Available from the library of the CIEN E-mail: katia@cien.energia.inf.cu; belkis@cien.energia.inf.cu; Published only in CD-ROM
Record Type
Multimedia
Literature Type
Conference
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