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Clark, K.A.; Meehan, T.J.
CEA Grenoble, Lab. d'Electronique et de Technologie de l'Informatique, LETI, 38 (France)1999
CEA Grenoble, Lab. d'Electronique et de Technologie de l'Informatique, LETI, 38 (France)1999
AbstractAbstract
[en] This paper reports on the on-orbit data obtained from the MPTB RISC Processor Experiment, containing three Integrated Device Technologies R3081 processors. During operations, nine SEUs were observed in the processors, and four SEUs were observed in the memory and/or support circuitry. (authors)
Original Title
Banc de test de composants electroniques et optoelectroniques MPTB: retour d'experience en vol sur les cartes ''memoire de masse'' et processeurs RISC
Primary Subject
Source
1999; [2 p.]; 5. European conference on radiation and its effects on components and systems; 5. congres europeen les radiations et leurs effets sur les composants et les systemes; Abbaye de Fontevraud (France); 13-17 Sep 1999
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Miscellaneous
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Conference
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