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AbstractAbstract
[en] We have measured energy and angular distributions of secondary ions emitted from a C60 film target bombarded by 4 MeV 28Si3+ ions. Fullerene-like secondary ions of C60-2n+ as well C60+ ions and multiples of C60 such as C60N+ (N=2, 3) ions were observed strongly. It is found that the angular distributions of C60+ ion are found to be slightly inclined from the surface normal. (author)
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Source
4 refs., 2 figs.
Record Type
Journal Article
Journal
Annual Report of Quantum Science and Engineering Center; ISSN 1345-0700;
; v. 5; p. 1-3

Country of publication
BEAMS, CALCULATION METHODS, CARBON, CHARGED PARTICLES, COLLISIONS, DISTRIBUTION, DYNAMIC MASS SPECTROMETERS, ELEMENTS, EMISSION, ENERGY RANGE, ION BEAMS, ION COLLISIONS, IONS, MASS SPECTROMETERS, MEASURING INSTRUMENTS, MEV RANGE, MOLECULE COLLISIONS, NONMETALS, SIMULATION, SPECTRA, SPECTROMETERS, TIME-OF-FLIGHT SPECTROMETERS
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