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AbstractAbstract
[en] The present work investigates the electronic properties of thin epitaxial silicon films and their suitability for microelectronic and photovoltaic applications. The films are grown by ion-assisted deposition (IAD), a molecular beam epitaxy (MBE) method that uses a small fraction of accelerated Si+-ions in the molecular beam, allowing for additional kinetic energy transfer to the substrate during low temperature epitaxy. (orig.)
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Source
Berichte aus der Halbleitertechnik; 2003; 138 p; Shaker; Aachen (Germany); ISBN 3-8322-1807-6;
; ISSN 0945-0785;
; Diss. (Dr.-Ing.)


Record Type
Book
Literature Type
Thesis/Dissertation
Country of publication
CARRIER LIFETIME, CRYSTAL DEFECTS, ION COLLISIONS, MOLECULAR BEAM EPITAXY, MONOCRYSTALS, PHYSICAL RADIATION EFFECTS, POLYCRYSTALS, QUANTUM EFFICIENCY, SILICON, SILICON IONS, SUBSTRATES, TEMPERATURE DEPENDENCE, TEMPERATURE RANGE 0065-0273 K, TEMPERATURE RANGE 0273-0400 K, TEMPERATURE RANGE 0400-1000 K, THIN FILMS
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