[en] We have used transmission electron microscopy and characterized the microstructure in thin films of La_1-xTe_xMnO₃ (x=0.1, 0.2) compounds, which are new additions to the family of colossal magnetoresistance (CMR) oxides. Electron diffraction and high-resolution imaging reveal that Te-doped thin films with a thickness of 100 nm for x=0.1 and 200 nm for x=0.2 are epitaxially grown on the SrTiO₃ (001) substrate. On the basis of electron diffraction patterns obtained from cross-section and plan-view specimens, the new compounds are determined to have an orthorhombic unit cell with lattice parameters a_o ∼2^1/2a_p=0.54 nm, b_o ∼2a_p=0.77 nm, c_o∼2^1/2a _p=0.54 nm, where a _p is the lattice parameter of an ideal cubic perovskite structure, 0.39 nm. The microstructures in orthorhombic La_1-xTe_xMnO₃ compounds are clarified in terms of two 90 -oriented domains, both of which are grown with [101] axis perpendicular to the substrate surface. (copyright 2003 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)