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Das, N.C.; Jha, S.N.; Bhattacharyya, D.; Sinha, A.K.; Mishra, V.K.; Verma, Vishnu; Ghosh, A.K.
Bhabha Atomic Research Centre, Mumbai (India)2002
Bhabha Atomic Research Centre, Mumbai (India)2002
AbstractAbstract
[en] An extended x-ray absorption fine structure (EXAFS) beam line for x-ray absorption studies using energy dispersive geometry and position sensitive detector is being designed for the INDUS-II Synchrotron source. The beam line would be used for doing x-ray absorption experiments involving measurements of fme structures above the absorption edge of different species of atoms in a material The results of the above experiments would lead to the determination of different important structural parameters of materials viz.. inter-atomic distance. co-ordination number, degree of disorder and radial distribution function etc. The optical design of the beam line has been completed based on the working principle that a single crystal bent in the shape of an ellipse by a crystal bender would act as a dispersing as well as focusing element. The mechanical design of the beam line including the crystal bender has also been completed and discussed here. Calculations have been done to detennine the temperature profile on the different components of the beam line under exposure to synchrotron radiation and proper cooling channels have been designed to bring down the heat load on the components. (author)
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Nov 2002; 36 p; 7 refs., 20 figs., 5 tabs.
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