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Davidson, D.W.; Froejdh, C.; O'Shea, V.; Nilsson, H-E.; Rahman, M., E-mail: d.w.davidson@physics.gla.ac.uk2003
AbstractAbstract
[en] Flat-field correction methods are implemented in order to eliminate non-uniformities in X-ray imaging sensors. If the compensation is perfect, then the remaining variations result from noise over the detector area. The efficiency of the compensation is reduced when an object is placed in the beam. A principle cause of this effect is believed to be the spectrum hardening caused by the object. In a normal application the correction factors are calculated for a certain spectrum, meaning that the average of the correction for the individual photon energies are used. If the composition of the spectrum changes the correction factor will also change. In this paper, we present a theory for the sensitivity of the gain constants on X-ray spectra. The theory is supported by experimental data obtained with X-ray spectra and monochromatic X-rays
Primary Subject
Source
4. international workshop on radiation imaging detectors; Amsterdam (Netherlands); 8-12 Sep 2002; S0168900203015638; Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: India
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; ISSN 0168-9002;
; CODEN NIMAER; v. 509(1-3); p. 146-150

Country of publication
BOSONS, DETECTION, DIMENSIONS, ELECTROMAGNETIC RADIATION, ELEMENTARY PARTICLES, ESTERS, IONIZING RADIATIONS, MASSLESS PARTICLES, MATERIALS, ORGANIC COMPOUNDS, ORGANIC POLYMERS, PETROCHEMICALS, PETROLEUM PRODUCTS, PLASTICS, POLYACRYLATES, POLYMERS, POLYVINYLS, PROCESSING, RADIATION DETECTION, RADIATIONS, SPECTRA, SYNTHETIC MATERIALS
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