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AbstractAbstract
[en] Fluorine contamination on and below the surface of zircaloy has been studied by means of proton irradiation using a Van de Graaff accelerator and the detection of prompt gamma radiation from the 19F (p, αγ) 16O reaction. Formulae for deriving depth distributions of impurities from the measured counting rates have been derived. The influence of energy straggling on the depth resolution has been studied. Both the total amount and the depth distribution have been measured in samples, which have undergone different treatments. Because of the high yield from the reaction used, a quantity of fluorine less than 0. 01 μg/cm2 can be detected by this method
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Source
Jul 1966; 20 p; 9 refs., 10 figs., 1 tab.
Record Type
Report
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ALLOYS, BARYON REACTIONS, CHARGED-PARTICLE REACTIONS, ELEMENTS, EVEN-EVEN NUCLEI, HADRON REACTIONS, HALOGENS, ISOTOPES, LIGHT NUCLEI, NONMETALS, NUCLEAR REACTIONS, NUCLEI, NUCLEON REACTIONS, OXYGEN ISOTOPES, STABLE ISOTOPES, SURFACE TREATMENTS, TARGETS, TRANSITION ELEMENT ALLOYS, ZIRCONIUM ALLOYS, ZIRCONIUM BASE ALLOYS
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