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Alekseev, A. N.; Byrnaz, A. E.; Krasovitsky, D. M.; Pavlenko, M. V.; Petrov, S. I.; Pogorel'sky, Yu. V.; Sokolov, I. A.; Sokolov, M. A.; Stepanov, M. V.; Shkurko, A. P.; Chalyi, V. P., E-mail: support@semiteq.ru2007
AbstractAbstract
[en] The effect of growth conditions (V/III ratio, substrate temperature) on the properties of materials in AlN-GaN systems is discussed. A concept of the growth of the AlN/AlGaN/GaN multilayer heterostructure, which provides the improvement of crystal quality and surface morphology of the layers, is suggested and realized. The improvement of the properties of GaN in the AlN/AlGaN/GaN/AlGaN multilayer heterostructure is confirmed by a considerable increase in electron mobility in the two-dimensional electron gas formed at the upper heterointerface GaN/Al0.3Ga0.7N
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Copyright (c) 2007 Nauka/Interperiodica; Article Copyright (c) 2007 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA)
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