AFM examination of nanolayers synthesised by the molecular layering method on the surface of manufacturing glasses

Sosnov, E. A.; Dorofeev, V. P.; Malkov, A. A.; Malygin, A. A.; Kulikov, N. A.; Brusilovsky, G. L.

doi:10.1134/S1063782607050028

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Primary Subject
MATERIALS SCIENCE (1)

Subject Area
Nuclear Materials (1)

Record Type
Journal Article (1)

Literature Type

Journal Title
Semiconductors (1)

Publication Year
2007 (1)

Publication Year Range

2006 – 2010 (1)

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United States (1)

Language
English (1)

Descriptors
ATOMIC FORCE MICROSCOPY (1)
CHALCOGENIDES (1)
COATINGS (1)
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39 (1)

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DOI

AFM examination of nanolayers synthesised by the molecular layering method on the surface of manufacturing glasses

Sosnov, E. A.; Dorofeev, V. P.; Malkov, A. A.; Malygin, A. A.; Kulikov, N. A.; Brusilovsky, G. L.

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AbstractAbstract

[en] The surface topography of glass matrixes is investigated before and after oxide coatings caused by the molecular layering method. The conductance of synthesized nanolayers is investigated

Primary Subject

MATERIALS SCIENCE (S36)

Source

Record Type

Journal Article

Journal

Semiconductors; ISSN 1063-7826;

; CODEN SMICES; v. 41(5); p. 498-501

Country of publication

United States

Descriptors (DEI)

ATOMIC FORCE MICROSCOPY, COATINGS, GLASS, MANUFACTURING, OXIDES, SURFACES, TOPOGRAPHY

Descriptors (DEC)

CHALCOGENIDES, MICROSCOPY, OXYGEN COMPOUNDS

Publication YearPublication Year

2007

LanguageLanguage

English

Reference NumberReference Number

39098143

INIS VolumeINIS Volume

INIS IssueINIS Issue

External URLExternal URL

http://dx.doi.org/10.1134/S1063782607050028

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