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AbstractAbstract
[en] The diffusion of terbium in silicon in the temperature range of 1100-1250 deg. C is studied using the direct radioisotope technique for the first time. The diffusion parameters of terbium in silicon are determined
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Copyright (c) 2006 Nauka/Interperiodica; Article Copyright (c) 2006 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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