[en] Recently, high quality CdTe semiconductor detectors have been developed and studied as a detector for the next generation X-ray CT system. This CdTe X-ray CT system may introduce some artifacts due to the nonuniformity of the sensitivity of the detector and gaps between CdTe crystals due to the limitation in size. We proposed a new method for reducing these ring artifacts, and established a new prototype X-ray CT system with the semiconductor detector. We evaluated the performance of the system with some phantoms and confirmed the validity of this system. (author)