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Jiang Tingshun; Zhao Qian; Chen Kangmin; Tang Yajing; Yu Longbao; Yin Hengbo, E-mail: tshjiang@ujs.edu.cn2008
AbstractAbstract
[en] Co (Ni or Cu)-MCM-41 mesoporous molecular sieves with different amount of metal were synthesized by using cetyltrimethyl ammonium bromide as a template and by a novel microwave irradiation method. These samples were characterized by powder X-ray diffraction (XRD), transmission electron microscopy (TEM), Fourier transform infrared spectroscopy (FT-IR) and N2 physical adsorption. The experimental results show that Co (Ni or Cu)-MCM-41 mesoporous molecular sieves were successfully synthesized. When the as-synthesized samples were calcined at 550 deg. C for 10 h, the template was effectively removed. Under microwave irradiation condition, Co-MCM-41 mesoporous molecular sieves have specific surface areas in a range of 745.7-1188.8 m2/g and average pore sizes in a range of 2.46-2.75 nm; Ni-MCM-41 mesoporous molecular sieves have specific surface areas in a range of 625.8-1161.3 m2/g and average pore sizes of ca. 2.7 nm; Cu-MCM-41 mesoporous molecular sieves have specific surface areas in a range of 601.6-1142.9 m2/g and average pore sizes in a range of 2.46-2.76 nm. On the other hand, with increasing the introduced metal amount, the specific surface area and pore volume of the synthesized Co (Ni or Cu)-MCM-41 mesoporous molecular sieves became small, and the mesoporous ordering of the samples became poor. Under the comparable synthesis conditions, the synthesized Co-MCM-41 mesoporous molecular sieve has a bigger specific surface area and a more uniform pore distribution as compared with the synthesized Ni-MCM-41and Cu-MCM-41 mesoporous molecular sieves
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S0169-4332(07)01429-8; Available from http://dx.doi.org/10.1016/j.apsusc.2007.09.100; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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ADSORBENTS, BROMINE COMPOUNDS, COHERENT SCATTERING, DIFFRACTION, ELECTROMAGNETIC RADIATION, ELECTRON MICROSCOPY, ELEMENTS, HALIDES, HALOGEN COMPOUNDS, INTEGRAL TRANSFORMATIONS, MEASURING INSTRUMENTS, METALS, MICROSCOPY, PHYSICAL PROPERTIES, RADIATIONS, SCATTERING, SORPTION, SPECTRA, SPECTROMETERS, TRANSFORMATIONS, TRANSITION ELEMENTS
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