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Hosoya, H.; Arita, M.; Nishio, H.; Ohta, K.; Takezaki, K.; Hamada, K.; Takahashi, Y.; Choi, J.-B., E-mail: arita@nano.ist.hokudai.ac.jp2008
AbstractAbstract
[en] We prepared single-electron tunnelling (SET) transistors made of Fe nanodots and investigated their fundamental properties. The device films were composed of Fe nanodot arrays embedded in a SrF2 matrix fabricated by the co-evaporation method on thermally oxidized Si substrates. The Si substrates were used as backgate electrodes. The current-to-voltage curves between source and drain electrodes were nonlinear even at room temperature. Coulomb blockade was clearly observed at 8 K. Current oscillation which is another SET characteristic was confirmed in the curves of drain current versus gate voltage. The oscillation period was roughly estimated to be about 20-40 V
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Source
S0921-5107(07)00651-4; Available from http://dx.doi.org/10.1016/j.mseb.2007.11.023; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology; ISSN 0921-5107;
; CODEN MSBTEK; v. 147(1); p. 100-104

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