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AbstractAbstract
[en] The field amplitude and frequency dependent complex ac susceptibility χ(Hm,f) of three Y-Ba-Cu-O disks made by a top-seeded melt growth technique has been measured at 77 K with the ac field applied along the c-axis of the samples (parallel to their thickness). A procedure based on the Bean model has been developed to calculate the critical-current density Jc near the surface of the sample from the measured χ(Hm) for the case where the maximum imaginary component χ'' is not reached
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S0953-2048(08)76970-7; Available from http://dx.doi.org/10.1088/0953-2048/21/8/085013; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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