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AbstractAbstract
[en] Two strong thermal peaks in the wavelength range 220-420 nm have been detected at 128 and 140 K in LiF:Mg,Cu, at 123 and 135 K in LiF:Mg,Cu,P and at 125 and 133 K in LiF:Mg,Cu,Si, respectively. The origin of these main TL peaks is discussed in terms of defect perturbed H-F and VK-e type recombination, respectively. The relative intensity between the two peaks in each sample and the emission spectra are dependent on the dopants. Annealing at 240-390 deg. C can modify the low temperature TL features, especially in those samples doped with three impurities. The low temperature data give some clues to select most favourable dopants for future LiF-type dosimeters
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S0168-583X(08)00487-4; Available from http://dx.doi.org/10.1016/j.nimb.2008.03.199; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
Journal
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; ISSN 0168-583X;
; CODEN NIMBEU; v. 266(11); p. 2581-2586

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