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Huang Mianliang; Chang, Y. Austin, E-mail: mhuang@ameslab.gov2008
AbstractAbstract
[en] Phase transformation in Pd3In thin films has been investigated using transmission electron microscopy (TEM), X-ray diffraction (XRD), and differential scanning calorimetry (DSC). Pd3In films were sputtered onto room temperature substrates and characterized by TEM and XRD as disordered face centered cubic (fcc) structure. Ordered tetragonal structure was observed in the samples annealed up to 550 deg. C. DSC measurements gave a heat of transformation of 3.25 kJ/mol
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S0925-8388(07)00074-6; Available from http://dx.doi.org/10.1016/j.jallcom.2007.01.022; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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