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Chaabane, Nihed; Trocellier, Patrick; Poissonnet, Sylvie; Thome, Lionel, E-mail: nihed.chaabane@cea.fr2008
AbstractAbstract
[en] This paper reports the formation processes of crystalline Sn nanostructured films grown under ultra high vacuum conditions on monocrystalline yttria-stabilized zirconia (YSZ) substrates with (1 0 0) orientation. The microstructure of the films was analyzed using SEM and X-ray diffraction. Evaporation of Sn films yields crystallographically well-defined metallic islands of different shapes depending on the substrate temperature. The overall growth mechanism appears to follow the Stranski-Krastanov type. Irradiation of deposited films was performed at room temperature with 4 MeV Au2+ ions at a fluence of 1015 cm-2 to induce material decomposition and aggregation of host atoms. X-ray diffraction and Rutherford backscattering spectrometry (RBS) experiments conducted on Sn films deposited on YSZ(1 0 0) prior to and after irradiation demonstrate that ion irradiation drives a structural phase transformation for Sn and Zr-rich compositions. The microstructural evolution upon ion irradiation was also examined by cross-sectional transmission electron microscopy (TEM)
Primary Subject
Source
REI-14: 14. international conference on radiation effects in insulators; Caen (France); 28 Aug - 1 Sep 2007; S0168-583X(08)00464-3; Available from http://dx.doi.org/10.1016/j.nimb.2008.03.221; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; ISSN 0168-583X;
; CODEN NIMBEU; v. 266(12-13); p. 3148-3152

Country of publication
DECOMPOSITION, EVAPORATION, GOLD IONS, ION BEAMS, IRRADIATION, MEV RANGE 01-10, MICROSTRUCTURE, NANOSTRUCTURES, RUTHERFORD BACKSCATTERING SPECTROSCOPY, SCANNING ELECTRON MICROSCOPY, SUBSTRATES, TEMPERATURE RANGE 0273-0400 K, THIN FILMS, TRANSMISSION ELECTRON MICROSCOPY, X-RAY DIFFRACTION, YTTRIUM OXIDES, ZIRCONIUM OXIDES
BEAMS, CHALCOGENIDES, CHARGED PARTICLES, CHEMICAL REACTIONS, COHERENT SCATTERING, DIFFRACTION, ELECTRON MICROSCOPY, ENERGY RANGE, FILMS, IONS, MEV RANGE, MICROSCOPY, OXIDES, OXYGEN COMPOUNDS, PHASE TRANSFORMATIONS, SCATTERING, SPECTROSCOPY, TEMPERATURE RANGE, TRANSITION ELEMENT COMPOUNDS, YTTRIUM COMPOUNDS, ZIRCONIUM COMPOUNDS
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