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Tripathi, A.; Khan, S.A.; Kumar, Manvendra; Baranwal, V.; Krishna, R.; Kumar, Sarvesh; Pandey, A.C.; Avasthi, D.K., E-mail: ambuj@iuac.ernet.in2008
AbstractAbstract
[en] We have studied the angular distribution of 120 MeV Au ion beam induced sputtering yield for three cases: from crystalline highly oriented pyrolytic graphite (HOPG) for (A) normal and (B) 70 deg. incidence and from (C) amorphous carbon sample for normal incidence. An anisotropic distribution of sputtering is observed for HOPG samples studied with a distribution Y = Acosnθ + Bexp[-(θ - μ)2σ2]. Though the over-cosine function dependence is observed for all the cases, the anomalous peak observed at 53 deg. for normal incidence for HOPG sample is found to shift to 73 deg. when the sample is tilted by 20 deg. No peak is observed in the amorphous carbon sample which further confirms that the anisotropy observed is due to the crystal structure and formation of a pressure pulse. The high exponent of over-cosine distribution of sputtering yield (n = 3.2-3.8) signifies formation of intense pressure pulse induced jet like sputtering
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Source
18. international conference on ion beam analysis; Hyderabad (India); 23-28 Sep 2007; S0168-583X(08)00059-1; Available from http://dx.doi.org/10.1016/j.nimb.2008.01.032; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; ISSN 0168-583X;
; CODEN NIMBEU; v. 266(8); p. 1265-1268

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