Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.026 seconds
Irmler, C.; Friedl, M.; Pernicka, M., E-mail: irmler@hephy.oeaw.ac.at2010
AbstractAbstract
[en] A major upgrade of the KEKB factory (Tsukuba, Japan) is foreseen until 2013, aiming at a luminosity of up to 8x1035cm-2s-1, which is about 40 times the present value. Accordingly, a similar increase is expected for trigger rate and occupancy of the Silicon Vertex Detector (SVD). The current readout system has a shaping time of 800 ns, no multi-event memory and thus requires a trigger within this period. As it already operates at its limit, it obviously has to be replaced for the upgrade. We developed a readout system using the APV25 chip with a shaping time of 50 ns and an integrated analog pipeline. By taking six consecutive samples of the shaper output and processing these data with FPGAs on a VME module we can determine timing information of the hits with a precision of about 3 ns RMS, which enables occupancy reduction and thus eases subsequent track finding. Thanks to reading several samples the system can tolerate a trigger jitter of up to ±2 clocks. A dedicated pipelined data processor is implemented for each input, which encodes position, pulse height and time information of a hit in a single 32 bit word. The acceptable trigger rate is limited by the time needed to read out six samples from the APV25.
Primary Subject
Source
11. Pisa meeting on advanced detectors; La Biodola, Elba (Italy); 24-30 May 2009; S0168-9002(09)01928-7; Available from http://dx.doi.org/10.1016/j.nima.2009.10.023; Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; ISSN 0168-9002;
; CODEN NIMAER; v. 617(1-3); p. 280-282

Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue