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AbstractAbstract
[en] We present the CMS Pixel Data Quality Monitoring (DQM) system. The concept and architecture are discussed. The monitored quantities are introduced, and the methods on how to ensure that the detector takes high-quality data with large efficiency are explained. Finally we describe the automated data certification scheme, which is used to certify and classify the data from the Pixel detector for physics analyses.
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Source
11. Pisa meeting on advanced detectors; La Biodola, Elba (Italy); 24-30 May 2009; S0168-9002(09)01780-X; Available from http://dx.doi.org/10.1016/j.nima.2009.09.038; Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; ISSN 0168-9002;
; CODEN NIMAER; v. 617(1-3); p. 298-299

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