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AbstractAbstract
[en] In this work the structural properties of spintronic semiconductor and halfmetalic thin-film systems were investigated. The layer thicknesses and interface roughnesses of the multi-layer systems were estimated by X-ray reflectivity measurements. The fits were performed using the software Fewlay which uses the Parratt formalism to calculate the reflectivities. The relaxation of the films was analyzed by reciprocal space mapping on preferably highly indexed Bragg reflexes. (orig.)
Original Title
Roentgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Duennschichtsystemen
Primary Subject
Source
2010; 95 p; Diss. (Dr.rer.nat.)
Record Type
Miscellaneous
Literature Type
Thesis/Dissertation
Report Number
Country of publication
ANTIMONY ALLOYS, BRAGG REFLECTION, CADMIUM TELLURIDES, CRYSTAL STRUCTURE, F CODES, HETEROJUNCTIONS, HEUSLER ALLOYS, INTERFACES, LAYERS, MAXIMUM-LIKELIHOOD FIT, MERCURY TELLURIDES, NICKEL ALLOYS, RELAXATION, ROUGHNESS, SEMICONDUCTOR MATERIALS, SEMIMETALS, TERNARY ALLOY SYSTEMS, THICKNESS, THIN FILMS, X-RAY DIFFRACTION
ALLOY SYSTEMS, ALLOYS, ALUMINIUM ALLOYS, CADMIUM COMPOUNDS, CHALCOGENIDES, COHERENT SCATTERING, COMPUTER CODES, COPPER ALLOYS, COPPER BASE ALLOYS, CORROSION RESISTANT ALLOYS, DIFFRACTION, DIMENSIONS, ELEMENTS, FILMS, MANGANESE ALLOYS, MATERIALS, MATHEMATICAL SOLUTIONS, MERCURY COMPOUNDS, NUMERICAL SOLUTION, REFLECTION, SCATTERING, SEMICONDUCTOR JUNCTIONS, SURFACE PROPERTIES, TELLURIDES, TELLURIUM COMPOUNDS, TRANSITION ELEMENT ALLOYS
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