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Cho, J. Y.; Song, J. S.; Lee, C. C.; Park, S. Y.; Kim, K. Y.; Lee, K. H.
Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of)2010
Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of)2010
AbstractAbstract
[en] This report performs the uncertainty analysis for the SMART synthesis power distribution generated by a SSUN (SMART core SUpporting system coupled by Nuclear design code) code. SSUN runs coupled with the MASTER neutronics code and generates the core 3-D synthesis power distribution by using DPCM3D. The MASTER code plays a role to provide the DPCM3D constants to the SSUN code for the current core states. The uncertainties evaluated in this report are the form of 95%/95% probability/confidence one-sided tolerance limits and can be used in conjunction with Technical Specification limits on these quantities to establish appropriate LCO (Limiting Conditions of Operation) and LSSS (Limiting Safety System Settings) limits. This report is applicable to SMART nuclear reactor using fixed rhodium detector systems. The unknown true power distribution should be given for the uncertainty evaluation of the synthesis power distribution. This report produces virtual distributions for the true power distribution by imposing the CASMO-3/MASTER uncertainty to the MASTER power distribution. Detector signals are generated from these virtual distribution and the DPCM3D constants are from the MASTER power distribution. The SSUN code synthesizes the core 3-D power distribution by using these detector signals and the DPCM3D constants. The following summarizes the uncertainty evaluation procedure for the synthesis power distribution. (1) Generation of 3-D power distribution by MASTER -> Determination of the DPCM3D constants. (2) Generation of virtual power distribution (assumed to be true power distribution) -> Generation of detector signals. (3) Generation of synthesis power distribution. (4) Uncertainty evaluation for the synthesis power distribution. Chi-Square normality test rejects the hypothesis of normal distribution for the synthesis power error distribution. Therefore, the KRUSKAL WALLIS test and the non-parametric statistics are used for data pooling and the tolerance limits. The uncertainties for the 3-D, axially integrated and planar node power distribution are determined to be 5.4 %, 3.6 % and 5.0 %. The uncertainties for the peak pin power distribution are determined to be 5.8 %, 4.1 % and 5.3 %
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Jul 2010; 68 p; Also available from KAERI; 10 refs, 18 figs, 24 tabs
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