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[en] ZnO thin film on glass substrate by sputtering methods has been made. Result shown that the thin film had orientation of C axis perpendicular to the surface as indicated by the (002) peak of XRD. The electromechanical coupling constant had also been measured with the average value of 0.44 ± 0.08. (author)
Source
Sukarsono, R.; Ganang Suradjijo (National Nuclear Energy Agency, Yogyakarta (Indonesia)) (eds.); Centre for Research and Development of Advanced Technology, National Nuclear Energy Agency, Yogyakarta (Indonesia); 265 p; ISSN 0216-3128; 
; 2002; p. 39-47; Scientific Meeting and Presentation on Basic Research in Nuclear Science and Technology; Pertemuan dan Presentasi Ilmiah Penelitian Dasar Ilmu Pengetahuan dan Teknologi Nuklir; Yogyakarta (Indonesia); 27 Jun 2002; Also available from Center for Development of Nuclear Informatics, National Nuclear Energy Agency, Puspiptek Area, Fax. 62-21-7560923, PO BOX 4274, Jakarta (ID); 5 refs.; 1 tab.; 13 figs.
; 2002; p. 39-47; Scientific Meeting and Presentation on Basic Research in Nuclear Science and Technology; Pertemuan dan Presentasi Ilmiah Penelitian Dasar Ilmu Pengetahuan dan Teknologi Nuklir; Yogyakarta (Indonesia); 27 Jun 2002; Also available from Center for Development of Nuclear Informatics, National Nuclear Energy Agency, Puspiptek Area, Fax. 62-21-7560923, PO BOX 4274, Jakarta (ID); 5 refs.; 1 tab.; 13 figs.