[en] In order to improve the quality of ion beams extracted from ECR ion sources it is mandatory to better understand the relations between the plasma conditions and the beam properties. The present investigations concentrate on the analysis of different beam properties under the influence of various applications of frequency tuning and of multiple frequency heating. The changes in the microwave frequency feeding the plasma affect the electromagnetic field distribution and the dimension and position of the ECR surface inside the plasma chamber. This in turn has an influence on the generation of the extracted ion beam in terms of intensity, shape and emittance. In order to analyze the corresponding effects, measurements have been performed with the CAPRICE-Type ECRIS installed at the ECR Injector Setup (EIS) of GSI. The experimental setup uses a microwave sweep generator which feeds a TWTA (Traveling Wave Tube Amplifier) covering a wide frequency range from 12.5 to 16.5 GHz. This arrangement provides a precise determination of the frequencies and of the reflection coefficient along with the beam properties and it confirms again how the frequency and the corresponding electromagnetic field feeding the plasma affects the ECRIS performances. A sequence of viewing targets positioned inside the beam line monitors the beam shape evolution. The paper is followed by the associated poster