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Forster, J.S.; Leslie, J.R.; Laursen, T.
Atomic Energy of Canada Limited, Chalk River, Ontario (Canada)1990
Atomic Energy of Canada Limited, Chalk River, Ontario (Canada)1990
AbstractAbstract
[en] The new technique for profiling light elements in thin, self-supporting foils, which uses a coincidence measurement over very large solid angles, has been demonstrated experimentally. A beam of 2.0 MeV 4He particles was used to bombard films of (i) cracked ethylene and (ii) evaporated carbon which was subsequently implanted with 7.5 keV 1H+ ions to a concentration of 1017/cm2. Plots of Eα vs Ep clearly show the 1H distributions in the foil. (author)
Source
1990; 5 p; Also published in: Nuclear Instruments and Methods in Physics Research B, 1990, Vol. 45, p. 176-180; 10 refs., 6 figs.
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