Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.015 seconds
Zhai Aibin; Cui Zhitong; Chen Xiangyue; Sun Beiyun
Proceedings of 7.national conference on nuclear instrument and it's application and 5. national conference on nuclear reactor instrument2009
Proceedings of 7.national conference on nuclear instrument and it's application and 5. national conference on nuclear reactor instrument2009
AbstractAbstract
[en] One small single-chip system for data transmission was built in this paper, the EMP susceptive cell and effect threshold of this system were researched. The damage effect of EMP was analysed for the system. The results show that MAX232 chip is EMP susceptivity cell of the system, the effect threshold and effect phenomenon of EMP of the different batches chips are different. The study can provide experiment method and data reference for EMP damage effect of system-level's electric equipment. (authors)
Primary Subject
Source
Nuclear Electronics and Nuclear Detection Technology Branch Society, China Institute of Electronics, Beijing (China); Nuclear Electronics and Nuclear Detection Technology Branch Society, Chinese Nuclear Society, Beijing (China); 336 p; Jul 2009; p. 55-60; 7. national conference on nuclear instrument and it's application; Xining (China); 20-27 Jul 2009; 5. national conference on nuclear reactor instrument; Xining (China); 20-27 Jul 2009; Available from China Nuclear Information Centre (China Institute of Nuclear Information & Economics), inisservice_cn@163.com; 10 figs., 3 tabs., 10 refs.
Record Type
Miscellaneous
Literature Type
Conference
Country of publication
Reference NumberReference Number
Related RecordRelated Record
INIS VolumeINIS Volume
INIS IssueINIS Issue