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Heikinheimo, E.; Louhenkilpi, S.; Pinard, P.T.; Richter, S.; Llovet, X., E-mail: erkki.heikinheimo@aalto.fi2016
AbstractAbstract
[en] Interest in the use of EPMA at low voltage has grown considerably in recent years, mainly because of the availability of electron-beam instruments equipped with field-emission guns. However, EPMA at low voltage is marred by both experimental and analytical problems which may affect the accuracy of quantitative results. In the case of the analysis of transition elements, both the emission and absorption of X-rays are still poorly understood when they originate from electron transitions involving the partially filled 3d-shell. This is the case for the most intense Lα (L_3-M_5 transition) and Lβ (L_2-M_4 transition) lines. In this communication, we point out anomalies which appear to afflict the accuracy of EPMA of Ni-silicides using the Ni-Lα X-ray line and we discuss possible solutions. (paper)
Source
EMAS 2015 Workshop: 14. European workshop on modern developments and applications in microbeam analysis; Portoroz (Slovenia); 3-7 May 2015; Available from http://dx.doi.org/10.1088/1757-899X/109/1/012005; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
IOP Conference Series. Materials Science and Engineering (Online); ISSN 1757-899X;
; v. 109(1); [10 p.]

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