[en] Schramm–Loewner Evolution (SLE) is a stochastic process that, by focusing on the geometrical features of the two-dimensional (2D) conformal invariant models, classifies them using one real parameter κ. In this work we apply the SLE formalism to the exterior frontiers of the geometrical clusters (interfaces) of the two-dimensional critical Ising model on the triangular lattice. We first analyze the critical curves going from the real axis to the real axis in the upper half plane geometry and show numerically that SLE(κ, κ − 6) works well to extract the diffusivity parameter κ. We then analyze the conformal loops of the critical Ising model. After determining some geometrical exponents of the critical loops as the interfaces of the model in hand, we address the problem of application of SLE to conformal loops. We numerically show that SLE(κ, κ − 6) is more reliable than previous methods. (paper)