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AbstractAbstract
[en] The influence of charged impurities on the transport properties of graphene, including the diffusion coefficient at low and high electric fields, is investigated by means of an ensemble Monte Carlo simulator. Three different possible substrates are considered, h-BN, SiC and SiO_2. The results show the importance of impurity scattering in degrading the diffusion coefficient, electronic mobility and drift velocity, particularly at low and intermediate electric fields. The influence of the substrate dielectric constant in relation to impurities and surface polar phonon scattering is also evidenced; this turns SiC into the most suitable substrate of choice from this point of view. (paper)
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Source
EDISON'19: 19. international conference on electron dynamics in semiconductors, optoelectronics and nanostructures; Salamanca (Spain); 29 Jun - 2 Jul 2015; Available from http://dx.doi.org/10.1088/1742-6596/647/1/012046; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
Journal of Physics. Conference Series (Online); ISSN 1742-6596;
; v. 647(1); [4 p.]

Country of publication
ANALOG SYSTEMS, BORON COMPOUNDS, CALCULATION METHODS, CARBIDES, CARBON, CARBON COMPOUNDS, CHALCOGENIDES, DIELECTRIC PROPERTIES, ELECTRICAL PROPERTIES, ELEMENTARY PARTICLES, ELEMENTS, FERMIONS, FUNCTIONAL MODELS, LEPTONS, MATERIALS, MINERALS, NITRIDES, NITROGEN COMPOUNDS, NONMETALS, OXIDE MINERALS, OXIDES, OXYGEN COMPOUNDS, PHYSICAL PROPERTIES, PNICTIDES, QUASI PARTICLES, SEMIMETALS, SILICON COMPOUNDS
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