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Park, Joonkyu; Kim, Dong-Whan; Woo, Ju Yeon; Lee, Jun; Han, Chang-Soo, E-mail: cshan@korea.ac.kr2015
AbstractAbstract
[en] We report the restoration of electrical properties found in graphene field-effect transistors (G-FETs) Joule heated with water. Since polymer contaminates the graphene surface during the transfer process and device fabrication, the graphene becomes p-doped so that we can hardly measure its charge neutrality point (CNP) with a gate voltage even up to 100 V. When the p-doped G-FET covered by water is Joule heated, on the other hand, the CNP is restored almost to the zero gate voltage. Based on the results derived from I _d–V _g characteristics and Raman spectroscopy, we argue that the polymers on graphene were removed whilst it was Joule heated, resulting in high de-doping of the graphene, leading to the easy process for the fabrication of high performance G-FET. (paper)
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Available from http://dx.doi.org/10.1088/0022-3727/48/45/455102; Country of input: International Atomic Energy Agency (IAEA)
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